MAX2135A maxim integrated products. all rights reserved. page 1/5 reliability report for MAX2135Aetn+ plastic encapsulated devices march 04, 2011 maxim integrated products 120 san gabriel dr. sunnyvale, ca 94086 approved by don lipps quality assurance manager, reliability engineering
MAX2135A maxim integrated products. all rights reserved. page 2/5 conclusion the MAX2135Aetn+ successfully meets the quality and reliability standards required of all maxim products. in addition, maxims continuous reliability monitoring program ensures that all outgoing product will continue to meet maxims quality and reliabili ty standards. table of contents i. ........device description iv. .......die information ii. ........manufacturing information v. ........quality assurance information iii. .......packaging information vi. .......reliability evaluation .....attachments i. device description a. general the MAX2135A low-power, 6mhz isdb-t and 6mhz/7mhz/8mhz dvb-t low-if diversity tuner directly converts broadcast isdb-t and dvb- t signals to a low-if using a broadband i/q downconverter. the operating frequency range covers the vhf and uhf broadcast tv bands from 9 0mhz to 862mhz. the MAX2135A integrates lnas, rf variable-gain amplifiers (vgas), vhf and uhf tracking filters, i/q downconverting mix ers, baseband vgas, and low-if filters. the device also includes a fully monolithic vco and tank circuit as well as a complete frequency synt hesizer including an on-chip crystal oscillator and output buffer/divider. the device incorporates a 2-wire (i2c) serial control interface with multiple read and write addresses. a low-power standby mode is available whereupon the signal path is shut down while leaving the serial control interf ace and register circuits active. additionally, the entire device can be shut down by an external pin. the MAX2135A is available in a 56-pin th in qfn package (7mm x 7mm) with an exposed paddle. electrical performance is guaranteed over the extended -40c to +85c temperature range.
MAX2135A maxim integrated products. all rights reserved. page 3/5 ii. manufacturing information a. description/function: isd b-t/dvb-t diversity tuner b . process: mb3 c. n um ber of device transistors: 686 33 d. fabrication location: californi a e . assembly location: th ailand f. date of initial production: january 10, 2010 iii. packaging information a. package type: 56-pin tqfn 7x7 b . lead frame: coppe r c. le ad f inish: 100% matte tin d. die attach: conducti ve e. bondwire: au (1 mil dia.) f. mold material: epoxy with silica filler g. assembly diagram: #05-9000-337 3 h . flammability rating: class u l9 4-v 0 i. classification of moisture sensitivity per jedec standard j-std-02 0-c level 1 j. single layer theta ja: 36c/w k. s ingle layer theta jc: 1c/w l . multi l ay er theta ja: 25c/w m. multi layer theta jc: 1 c/w iv. die information a. dimensions: 146.85 x 144.49 mils b. passivation: bcb c. interconnect: al with top la yer 100% cu d. backside metallization: non e e . minimum metal width: 0.35m f. minimum metal spacing: 0.35m g. b ondpad dime nsions : 5 mil. sq. h. is olatio n di elec tric: sio 2 i. die separation method: w afer saw
MAX2135A maxim integrated products. all rights reserved. page 4/5 = ___1___ = _ ______1.83 _______ (chi square value for mttf upper limit) mttf 192 x 4340 x 96 x 2 (where 4340 = temperature acceleration factor assuming an activation energy of 0.8ev) v. quality assurance information a. quality assurance contacts: ken wendel (director, reliability engineering) bryan preeshl (managing director of qa) b. outgoing inspection level: 0.1% for all electrical parameters guaranteed by the datasheet. 0.1% for all visual defects. c. observed outgoing defect rate: < 50 ppm d. sampling plan: mil-std-105d vi. reliability evaluation a. accelerated life test the results of the 135c biased (static) life test are shown in table 1. using these results, the failure rate ( ) is calculated as follows: = 11.5 x 10 -9 = 11.5 f.i.t. (60% confidence level @ 25c) the following failure rate represents data collected from maxims reliability monitor program. maxim performs quarterly life t est monitors on its processes. this data is published in the reliability report found at http://www.maxim-ic.com/qa/reliability/mon itor. cumulative monitor data for the mb3 process results in a fit rate of 0.08 @ 25c and 1.33 @ 55c (0.8 ev, 60% ucl) b. moisture resistance tests the industry standard 85c/85%rh or hast testing is monitored per device process once a quarter. c. e.s.d. and latch-up testing the wg53-1 die type has been found to have all pins able to withstand a hbm transient pulse of +/-2500v per jedec jesd22-a114. latch-up testing has shown that this device withstands a current of +/-250ma.
MAX2135A maxim integrated products. all rights reserved. page 5/5 table 1 reliability evaluation test results MAX2135Aetn+ test item test condition failure identification sample size number of failures static life test (note 1) ta = 135c biased time = 192 hrs. dc parameters & functionality 96 0 moisture testing (note 2) hast ta = 130c rh = 85% biased time = 96hrs. dc parameters & functionality 77 0 mechanical stress (note 2) temperature cycle -65c/150c 1000 cycles method 1010 dc parameters & functionality 77 0 note 1: life test data may represent plastic dip qualification lots. note 2: generic package/process data
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